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Microelectronic Reliability by Emiliano Pollino, Paperback | Indigo Chapters
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Microelectronic Reliability by Emiliano Pollino, Paperback | Indigo Chapters
From Emiliano Pollino
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Size: 1.6 x 9.26 x 2.4
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A companion to v.1 (which covers reliability, test, and diagnostics), this volume explains the main failure mechanisms which may affect silicon devices and shows their effect on reliability characteristics. Due to the importance of VLSI devices, emphasis is given to metalizations and latch-up. Acidi | Microelectronic Reliability by Emiliano Pollino, Paperback | Indigo Chapters