Characterization And Measurement Of Passive And Active Metamaterial Devices by Christopher A Lundell, Paperback | Indigo Chapters

This document addresses two major obstacles facing metamaterial development: uncertainty in the characterization of electromagnetic field behavior in metamaterial structures and the relatively small operational bandwidth of metamaterial structures. To address the first obstacle, a new method to characterize electromagnetic field behavior in a metamaterial is presented. This new method is a bistatic radar cross section (RCS) measurement technique. RCS measurements are well-suited to measuring bulk metamaterial samples because they show frequency dependence of scattering angles and offer common postprocessing techniques that can be useful for visualizing results. | Characterization And Measurement Of Passive And Active Metamaterial Devices by Christopher A Lundell, Paperback | Indigo Chapters